大范圍掃描開(kāi)爾文探針系統(tǒng)可以選配高性能的光學(xué)/法拉第外殼屏蔽外殼,使其免受不必要的快速變化的環(huán)境條件、電磁干擾,并為我們的環(huán)境壓力光電發(fā)射光譜和表面光電壓附加模塊提供了的平臺(tái)。
大范圍掃描開(kāi)爾文探針系統(tǒng)特色
用開(kāi)爾文探針測(cè)量功函數(shù)
1-3mev的功函數(shù)分辨率
掃描范圍從50毫米到300毫米
掃描分辨率等于針尖直徑
自動(dòng)高度調(diào)節(jié)
大范圍掃描開(kāi)爾文探針系統(tǒng)應(yīng)用
防腐,碳鋼,薄膜,太陽(yáng)能電池,氧化鉬,氧化鋅納米線薄膜,量子點(diǎn),空穴傳輸,納米顆粒,石墨烯,有機(jī)發(fā)光二極管。
大范圍掃描開(kāi)爾文探針掃描結(jié)果
型號(hào) | SKP5050 | ASKP100100 | ASKP200250 | ASKP350350 |
Tip material / diameter | Standard 2 mm gold tip (0.05 mm available on request) | |||
Work function resolution | 1 - 3 meV | |||
Sample scan size | 50 x 50 mm | 100 x 100 mm | 200 x 250 mm | 350 x 350 mm |
3D sample area | Square | Square | Square | Square and circular |
Height control (auto) | 25 mm | 50 mm | 50 mm | 50 mm |
Visualisation | 3D map of surface potential | |||
Optical system | Colour camera with zoom lens and monitor | |||
Oscilloscope | Digital TFT oscilloscope for real time signal | |||
Test sample | Gold and aluminium test sample | |||
Faraday enclosure base | 450 x 450 mm | 300 x 300 mm | 450 x 450 mm | 450 x 600 mm |
Control supplied | PC control with dedicated software for full control of all parameters | |||
Detection system | Off-null with parasitic capacity rejection | |||
Warranty | Twelve months |