深圳市世家儀器有限公司
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產(chǎn)品型號81134A
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更新時間:2022-01-24 12:41:01瀏覽次數(shù):80次
聯(lián)系我時,請告知來自 儀表網(wǎng)描述Keysight 81134A雙通道3.35 GHz脈沖碼型發(fā)生器是是德一代高速脈沖碼型發(fā)生器產(chǎn)品。在定時和性能非常關(guān)鍵的應(yīng)用環(huán)境(例如類似PCI Express和串行ATA的高速串行總線應(yīng)用),其快速上升時間和低抖動可以精確地檢定設(shè)備,并使抖動源注入的抖動影響達(dá)到最小。與其先一代產(chǎn)品Keysight 8133A類似,新型81134A也為高速應(yīng)用定義了標(biāo)準(zhǔn)。除此之外,81134A還可以......
主要特性與技術(shù)指標(biāo)
頻率范圍:15 MHz - 3.35 GHz
兩個輸出通道
低抖動
快速上升時間(20%-80%)< 60 ps
延遲調(diào)制(抖動仿真)
可變交叉點(眼圖變形)
可使用50 mV 至2 V范圍內(nèi)的輸出電平處理LVDS應(yīng)用
PCI Express和串行ATA的預(yù)加重/去加重和靜噪功能
描述
Keysight 81134A雙通道3.35 GHz脈沖碼型發(fā)生器是是德一代高速脈沖碼型發(fā)生器產(chǎn)品。在定時和性能非常關(guān)鍵的應(yīng)用環(huán)境(例如類似PCI Express和串行ATA的高速串行總線應(yīng)用),其快速上升時間和低抖動可以精確地檢定設(shè)備,并使抖動源注入的抖動影響達(dá)到最小。與其先一代產(chǎn)品Keysight 8133A類似,新型81134A也為高速應(yīng)用定義了標(biāo)準(zhǔn)。除此之外,81134A還可以產(chǎn)生特定的應(yīng)用信號電平,比如預(yù)加重和去加重(PCI Express)或靜噪(串行ATA)等。Keysight 81134A可代替脈沖和數(shù)據(jù)源來幫助您測試被測器件(DUT)。
Main features and technical indicators
Frequency range: 15 MHz - 3.35 GHz
Two output channels
Low jitter
Fast rise time (20%-80%) < 60 ps
Delay modulation (jitter simulation)
Variable intersection (eye map distortion)
LVDS applications can be treated with output levels ranging from 50 mV to 2 V
Preaccentuation/de-accentuation and noise reduction features for PCI Express and serial ATA
describe
Keysight 81134A dual channel 3.35ghz pulse code generator is the latest generation of high-speed pulse code generator products. In timing and performance critical application environments (such as high-speed serial bus applications such as PCI Express and serial ATA), the fast rise time and low jitter can precisely calibrate the device and minimize jitter effects of jitter source injection. Similar to its predecessor, Keysight 8133A, the new 81134A also defines the standard for high-speed applications. In addition, 81134A can generate specific application signal levels, such as pre-weighted and de-weighted (PCI Express) or silent (serial ATA). Keysight 81134A replaces pulses and data sources to help you test the device under test (DUT).
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