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TPP-01 ED&D,試驗(yàn)短銷

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  • 型號(hào)TPP-01
  • 品牌
  • 所在地珠海市
  • 更新時(shí)間2018-05-15
  • 廠商性質(zhì)代理商
  • 入駐年限1
  • 實(shí)名認(rèn)證已認(rèn)證
  • 產(chǎn)品數(shù)量47
  • 人氣值565
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TPP-01試驗(yàn)指

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產(chǎn)品名稱: ED&D,試驗(yàn)短銷

型 號(hào):
TPP-01,Short Test Pin Probe

廠 商:
美國ED&D
ED&D,試驗(yàn)短銷 產(chǎn)品詳情

ACCESSIBILITY PROBES 試驗(yàn)探針
FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS
Model TPP-01: Short Test Pin Probe 試驗(yàn)短銷
產(chǎn)地:美國 品牌:ED&D
Model TPP-01: Short Test Pin Probe

Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards. Body is Delrin, tip is stainless steel.

NOTE: Don’t ever purchase an all plastic version - the tip is too narrow to maintain tip rigidity!

 


Model TPP-02: Long Test Pin Probe

This pin is used on appliances for verifying that there is no access to hazardous live parts of heating elements which could be touched accidentally by a tool (i.e. screwdriver). Meets IEC & EN requirements. Body is Delrin, tip is stainless steel.

 


Model UFP-01: Rigid Finger Probe

A “rigid” version of the International Test Finger, model TFP-01, (see next page). Used for force applications on openings (i.e. vents) as required by IEC, EN, UL and CSA Standards. Handle made of Delrin, rigid finger made of chrome plated steel.

 


Model TRP-02: 1.0mm Test Wire

Used to verify protection of persons against access with a wire. Meets IEC and EN Standards including IEC 529 for IP4 and suffix D codes. The handle and stop face are made of Delrin. The wire is made of stainless steel.

 


Model TRP-01: 2.5mm Test Rod

Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool. Meets IEC and EN Standards including IEC 529 for IP3 and suffix C codes. The handle and stop face are made of Delrin. The rod is made of stainless steel.

 


Model PCP-01: 3.0mm Preset Controls Probe

Used to verify protection against access to hazardous parts by use of a tool through holes which give access to pre-set controls. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN 61010-1, U- 3101-1, UL 3111-1 and CSA 1010-1. The handle and stop face are made of Delrin. The rod is stainless steel.

 


Model HLP-01: 4.0mm Hazardous Live Parts Probe

Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin. The rod is made of stainless steel.

 


Model TFP-01: Test Finger Probe

This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements - with integral palm simulator. This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IEC CB Scheme. Finger made of chrome plated steel. All parts precision machined.

 


Model ULP-01: UL Finger Probe

This is the “UL” test finger, researched and designed by UL and required by most UL Standards. Palm simulator and restricted joint movement simulates human finger movement. Made of all nylon. Bell-Core accessory available.

Model ULP-02: Articulated Probe with Discs

Probe is required by GR-1089-CORE. Probe is plastic with 2 precision Delrin? disks. The disks are positioned at 35 mm. and 9 mm. from the top of probe. It is used to verify protection from hazardous parts.

 


Model THN-01: Test Thorn Probe

 

For testing accessibility in appliances with visibly glowing heating elements. Also for testing parts supporting such elements. Complies with IEC, EN, UL & CSA requirements. Made entirely of stainless steel.

 


Model TSP-01: Test Sphere Probe

This probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.

 


Model TSP-02: Test Sphere Probe

This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish.

 


Model RTR-01: Rigidity Test Rod Probe

For testing enclosure rigidity in accordance with clause 8.1 of IEC 1010 and the EN, UL and CSA versions of this Standard. Handle is Delrin, tip is stainless steel.

 


Model TUP-01: Uninsulated Live Parts Probe

For testing accessibility in accordance with many UL Standards. The handle is Delrin and the tip is stainless steel.

 


Model EWP-01: Enameled Wire Probe

For testing accessibility in accordance with many UL Standards. In many Standards, this probe is used for access to enamel coated wire (i.e. transformers and inductors). The handle is Delrin and the tip is stainless steel.

 


Model HMP- 01: Hazardous Moving Parts Probe

For testing accessibility to hazardous moving parts such as access to fan blades through a fan finger guard. Complies with UL Standards. Made entirely of stainless steel, weighs 1 lb.

 


Model CP-01: Coin Probe

Four probes in one! Used to determine accessibility to shock hazards in many household and audio/video products, including Standards UL 1410 and UL 6500. Made entirely of nickel-plated steel.

 


Model TH-01: Test Hook Probe


 

Used on enclosures prior to accessibility testing. The test hook is “hooked” into vents and seams in the enclosure & then pulled with a force (usually 20N). The hook has a hole at its long end, for use in conjunction with a PFI series Force Gauge. Made entirely of stainless steel.

 


Model FNP-01: Finger Nail Probe


 

For testing the requirement of snap-in devices and snap together enclosures that protect the user from accessibility to hazardous parts. Complies with most Standards including IEC 335 based Standards and UL 1025.

 


Model BEP-01: Blunt-End Probe


 

Stainless steel probe required by various UL, CSA, IEC, and EN standards.

 


Model TTP-01:ecom Test Probe


 

Required by IEC, EN, and some UL and CSA standards to test accessibility to TNV circuits (ecom). The handle and stop face are Delrin, the tip is stainless steel.

美國.ED&D產(chǎn)品服務(wù)于:IBM ,美國航空暨太空總署,英代爾,蘋果, NCR ,索尼公司,太陽,飛利浦公司,思科, AT&T , Compaq , JVC , Hewlett-Packard ,摩托羅拉, Mat ,戴爾,3 Com 等公司;專為UL , CSA , ETL , TUV,Demko等試驗(yàn)室提供檢測產(chǎn)品.

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