深圳市鑫成通電子有限公司專業(yè)銷售美國泰克Tektronix P7508/P7506/P7504差分探頭
Features & Benefits
一、TriMode™ Probe – One Setup, Three Measurements without Adjusting Probe Tip Connections
●Differential
●Single Ended
●Common Mode (Requires only one probe vs. conventional probing techniques)
二、Signal Fidelity
●20 GHz P7520
●16 GHz P7516
●13 GHz P7513A
●8 GHz P7508
●6 GHz P7506
●4 GHz P7504
三、Versatile Connectivity – Solder Down, Handheld, Fixtured
●Variety of Solder-down Options
●TriMode™ Solder Tips
●Small Form Factor for High-density Probing
●Bandwidth Choices from 4 to 20 GHz
●1.5 m Extension Cable for High-temperature Probing
●Quickly and Reliably Connect to Multiple Probe Tips
●Precision Differential Probing Module – Optional Handheld and Fixtured Probing
●Small Precision Tapered Tips, an Articulated Joint for Compliance, and Variable Tip Spacing
●TekConnect® Interface – TekConnect Scope/Probe Control and Usability
●Direct Control from Probe Compensation Box or from Scope Menu
●Automated Measurement Control through the TekConnect® Interface to Connect to Tektronix Real-time Oscilloscopes
●View TriMode/Attentuation Settings on Probe Compensation Box from Top or End Panel
Applications
四、 ●Examples Include, but are Not Limited To:
●PCI Express II, Serial ATA III, DDR2, DDR3, QPI, XAUI
TriMode™ Probing, Connectivity, and Performance
TriMode™ Probing Architecture
One-probe setup makes differential， single ended ， and common mode measurements
accurately and definitively.
Tektronix is a known leader when it comes to signal fidelity and signal acquisition.
Building on our history of market-leading innovations in probing， we invented a
revolutionary probing architecture called “TriMode ？ Probing” that defines the
next-generation industry benchmark for usability and signal fidelity. This architecture
changes the rules of probing and allows you to work more effectively and efficiently.
By enabling unique functionality， the P7500 Series TriMode probes allow you to
switch between differential ， single ended ， and common mode measurements without
moving the probe from its connection points.
