它符合國(guó)標(biāo)GB/T 1409-2006,GB/T 1693-2007,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。
c類數(shù)顯Q表工作頻率范圍是10kHz～60MHz,是一種多功能、多用途、多量程數(shù)字化阻抗測(cè)試儀器。它是根據(jù)串聯(lián)諧振原理，以電壓比值刻度Q值的。它能測(cè)量高頻電感器的Q值，電感量和分布電容量；電容器的電容量和損耗角。配以?shī)A具BH916介質(zhì)損耗裝置還能對(duì)固態(tài)絕緣材料的高頻介質(zhì)損耗（tanδ）和介電常數(shù)（ε），高頻回路有效并聯(lián)及串聯(lián)電阻，傳輸線的特性阻抗等進(jìn)行測(cè)試。本Q表依照國(guó)家計(jì)量檢定規(guī)程：“JJF1073-2000高頻Q表校準(zhǔn)規(guī)范”執(zhí)行。
1 特點(diǎn)：
◎ 本公司創(chuàng)新的自動(dòng)Q值讀取技術(shù)，使測(cè)Q分辨率至0.1Q。
◎ DPLL合成發(fā)生1kHz～70MHz,測(cè)試信號(hào)。
◎ 低至20nH殘余電感，保證高頻時(shí)直讀Q值的誤差較小。
◎ 特制LCD屏菜單式顯示多參數(shù)：Q值，測(cè)試頻率，調(diào)諧狀態(tài)等。
◎ Q值量程自動(dòng)/手動(dòng)量程控制。
◎ 數(shù)字化Q值預(yù)置，能提高批量測(cè)試的可靠性和速度。
2 主要技術(shù)指標(biāo)：
2.1 測(cè)試信號(hào)頻率范圍：1kHz～70MHz，數(shù)字合成，可數(shù)字設(shè)置或連續(xù)調(diào)節(jié)，五位有效數(shù)顯。
2.2 Q值測(cè)量范圍：1～1000四位數(shù)顯，分辨率0.1Q。分100、316、999三檔，量程可自動(dòng)切換。
2.3 Q值固有誤差：±5%±3% 滿刻度值。
2.4 有效電感測(cè)量范圍：0.1µH～1000mH。
2.5 電感測(cè)量誤差：≤5%±0.02µH
2.6 調(diào)諧電容特性：
2.6.1可調(diào)電容范圍：40pF～500 pF。
2.6.2 精確度：±1% 或0.5pF。
2.6.3微調(diào)電容器：-3pF～0～+3pF，分辨率：0.2pF
2.6.4殘余電感值：約30nH。
2.7 Q預(yù)置功能：Q預(yù)置范圍：1～1000均可。被測(cè)件達(dá)到預(yù)置值后有“GO”顯示和蜂鳴聲提示。不合格件則顯示“NO GO”。
2.8 外形尺寸及重量：415×180×170（mm）,6.5kg。
BH916 介質(zhì)損耗測(cè)試裝置（數(shù)顯）
BH916D介質(zhì)損耗測(cè)試裝置與C類Q表及電感器配用，能對(duì)絕緣材料進(jìn)行高頻介質(zhì)損耗角正切值（tanδ）和介電常數(shù)（ε）的測(cè)試。它符合國(guó)標(biāo)GB/T 1409-2006,GB/T 1693-2007,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。
本測(cè)試裝置是由測(cè)微平板電容器組成，平板電容器一般用來(lái)夾被測(cè)樣品，配用Q表作為指示儀器。絕緣材料的損耗角正切值是通過(guò)被測(cè)樣品放進(jìn)平板電容器和不放進(jìn)樣品的Q值變化和厚度的刻度讀數(shù)變化通過(guò)公式計(jì)算得到。同樣，由平板電容器的刻度讀數(shù)變化，通過(guò)公式計(jì)算得到介電常數(shù)。
1工作特性
1.1 平板電容器：
1.1.1 極片尺寸：
WY916D-38：Φ38mm.
WY916D-50：Φ50mm.
1.1.2 極片間距可調(diào)范圍和分辨率：
≥8mm， ±0.002mm
1.2 夾具插頭間距：
25mm±1mm
1.3夾具損耗角正切值
≤2.5×10-4
附表二,LKI-1電感組典型測(cè)試數(shù)據(jù)
線圈號(hào) 測(cè)試頻率 Q值 分布電容p 電感值
9 100KHz 98 9.4 25mH
8 400KHz 138 11.4 4.87mH
7 400KHz 202 16 0.99mH
6 1MHz 196 13 252μH
5 2MHz 198 8.7 49.8μH
4 4.5MHz 231 7 10μH
3 12MHz 193 6.9 2.49μH
2 12MHz 229 6.4 0.508μH
1 25MHz 50MHz 233211 0.9 0.125μH
標(biāo)簽：介電常數(shù)介質(zhì)損耗測(cè)試儀 介電常數(shù)測(cè)試儀 介質(zhì)損耗測(cè)試儀 介質(zhì)損耗介電常數(shù)測(cè)試儀
It accords with the national standard GB/T 1409-2006, GB/T 1693-2007, American Standard ASTM D150 ａnd IEC60250 specifications.
Class C digital Q frequency range is 10kHz ~ 60MHz, is a multifunctional,multipurpose, multi range digital impedance test instrument. It is based on theprinciple of series resonance, the voltage ratio scales of Q value. It can measure theQ value of the high frequency inductor, inductance ａnd distributed capacitance;capacitance and loss angle. With a dedicated fixture BH916 dielectric loss device also on high frequency dielectric loss of solid insulating materials （tan delta） ａnd Permittivity （epsilon）, high frequency circuit in parallel and series resistance, the characteristic impedance of the transmission line were investigated. The Q table in accordance with the national metrological verification regulations: "JJF1073-2000 high frequency Q calibration specification".
1 characteristics:
Read the technology of automatic Q of the company innovation value, the Qresolution to 0.1Q.
The synthesis of DPLL 1kHz ~ 70MHz, the test signal.
In the low to 20nH residual inductance, high frequency to ensure error is smaller by Q value.
Multi parameter of the special LCD screen menu display: Q value, the test frequency,the tuning status.
The Q value range automatic / manual range control.
The digital Q value preset, can improve the speed and reliability of the batch test.
2 main technical indexes:
The 2.1 test signal frequency range: 1kHz ~ 70MHz, digital synthesis, digital set oradjusted continuously, five effective digital display.
2.2 Q value range: 1 ~ 1000 four bit digital display, resolution 0.1Q. In 100, 316, 999third, range can be automatically switched.
2.3 Q values inherent error: ± 5% ± 3% of full scale value.
2.4 the effective inductance measurement range: 0.1 µ H ~ 1000mH.
The 2.5 inductance measurement error: = 5% ± 0.02 µ H
2.6 tuning capacitance characteristics:
2.6.1 adjustable capacitance range: 40pF ~ 500 pF.
2.6.2: accuracy of ± 1% or 0.5pF.
2.6.3 tuning capacitors are: -3pF ~ 0 ~ +3pF, resolution: 0.2pF
2.6.4 residual inductance: about 30nH.
2.7 Q preset function: Q preset range: 1 ~ 1000 may. The measured piece reaches a preset value "GO" display and beep prompt. The unqualified parts is displayed "NOGO".
2.8 dimensions and weight: 415 x 180 x 170 （mm）, 6.5kg.
BH916 dielectric loss test device （Shu Xian）
Dielectric loss test device ａnd the C BH916D Q table and the inductor with theinsulating materials, high frequency dielectric loss tangent （tan delta） ａnd Permittivity（epsilon） test. It accords with the national standard GB/T 1409-2006, GB/T 1693-2007, American Standard ASTM D150 ａnd IEC60250 specifications.
The testing device is composed of a micrometer capacitor plate, plate capacitor is usually used to clamp the sample, equipped with the Q table as indicating instrument.Insulating material loss angle tangent value is calculated by the formula of scale reading changes through the tested sample into the panel capacitor and do not put it in the samples of Q value change and the thickness of the obtained. Similarly, thescale reading changes of the panel capacitor, to obtain the dielectric constant is calculated by a formula.
The 1 job characteristics
1.1 the panel capacitor:
1.1.1 sheet size:
WY916D-38: a 38mm.
WY916D-50: a 50mm.
The 1.1.2 pole spacing adjustable range and resolution:
≥ 8mm, ± 0.002mm
The 1.2 fixture plug spacing:
25mm + 1mm
The 1.3 fixture loss angle tangent value
≤ 2.5 × 10-4
Table two, LKI-1 inductance group typical test data
Coil test frequency distributions of Q values of P inductance capacitance
9 100KHz 989.4 25mH
8 400KHz 13811.4 4.87mH
7 400KHz 20216 0.99mH
6 1MHz H
5 2MHz 1988.7 49.8 μ
4 4.5MHz 231710 H
3 12MHz 1936.9 2.49 μ
2 12MHz 2296.4 0.508 μ
1 25MHz 50MHz 2332110.9 0.125 μ
Tags: dielectric loss tester dielectric constant test dielectric loss tester dielectric lossdielectric constant test
