| qp-fast | 10 | 統(tǒng)一質(zhì)量SPM探針,三個矩形懸臂,軟/標(biāo)準(zhǔn)/快速/動態(tài)AFM分別成像, |
| 20 | ||
| 50 | ||
| qp-HBC | 10 | 鍍層: 懸臂背面鍍鋁； 針尖形狀: 角錐形; 懸臂梁: 頻率 60 kHz 力常數(shù) 0.5 N/m 長度 115 μm; 應(yīng)用范圍：智能探針 |
| 20 | ||
| 50 | ||
| qp-BioT | 10 | qp-BioT探針有兩個三角懸臂梁，懸臂梁: 力常數(shù) 0.08 N/m 0.3 N/m; 應(yīng)用范圍：生物探針、液體探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學(xué)研究和生物測試 |
| 20 | ||
| 50 | ||
| qp-BioAC | 10 | qp-BioAC探針三個懸臂梁，懸臂梁: 力常數(shù) 0.06 N/m 0.1 N/m 0.3 N/m; 應(yīng)用范圍：生物探針、液體探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學(xué)研究和生物測試 |
| 20 | ||
| 50 | ||
| qp-BioAC-CI | 10 | qp-BioAC-CI探針三個懸臂梁，懸臂梁: 力常數(shù) 0.06 N/m 0.1 N/m 0.3 N/m; 應(yīng)用范圍：生物探針,細(xì)胞探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學(xué)研究和細(xì)胞測試 |
| 20 | ||
| 50 | ||
| PtSi-NCH | 10 | 新導(dǎo)電探針，鍍層: 鉑硅； 比常規(guī)導(dǎo)電探針更耐磨，電學(xué)信號更長久，重復(fù)性好、分辨率高。應(yīng)用范圍：導(dǎo)電探針 |
| 20 | ||
| 50 | ||
| ATEC-NC | 10 | 輕敲探針，鍍層: 無； 針尖可視的探針，可應(yīng)用到對于那些針尖需要被精確定位或必須針尖可見的應(yīng)用（例如，用于納米操作）來說，ATEC是必然的。由于其很小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測量中表現(xiàn)出很好的性能。 |
| 20 | ||
| 50 | ||
| ATEC-NCPt | 10 | 導(dǎo)電探針，鍍層: 鉑銥； 針尖可視的探針，可應(yīng)用到對于那些針尖需要被精確定位或必須針尖可見的應(yīng)用（例如，用于納米操作）來說，ATEC是必然的。由于其很小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測量中表現(xiàn)出很好的性能。 |
| 20 | ||
| 50 | ||
| PPP-NCH | 10 | 輕敲探針，鍍層: 無； 其小于7納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PPP-NCH-W | 380 | |
| PPP-NCHR | 15 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PPP-NCHR-W | 380 | |
| PPP-NCHPt | 10 | 導(dǎo)電探針，鍍層: 鉑銥； 其小于25納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PPP-NCHPt-W | 380 | |
| ATEC-NCAu | 10 | 導(dǎo)電探針，鍍層: 金； 針尖可視的探針，可應(yīng)用到對于那些針尖需要被精確定位或必須針尖可見的應(yīng)用（例如，用于納米操作）來說，ATEC是必然的。由于其很小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測量中表現(xiàn)出很好的性能。 |
| PPP-NCHAu | 10 | 導(dǎo)電探針，鍍層: 金； 其小于25納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| PPP-NCHAuD | 10 | 導(dǎo)電探針，鍍層: 金； 其小于25納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| PPP-XYNCHR | 10 | 輕敲探針，鍍層: 懸臂背面鍍金； 此探針具有杰出的運行穩(wěn)定性，優(yōu)異的靈敏度以及快速掃描能力。 |
| 20 | ||
| 50 | ||
| PPP-QNCHR | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| PPP-RT-NCHR | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 其小于7納米的典型半徑和很小的探針個體差異提高了圖像的分辨率并保證了圖像的可重復(fù)性。 |
| 20 | ||
| 50 | ||
| PL2-NCH-10 | 10 | 輕敲探針，鍍層: 無；應(yīng)用:Plateau AFM Tips |
|
PL2-NCHR-10 | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁；應(yīng)用:Plateau AFM Tips |
|
TL-NCH | 10 | tipless探針，鍍層: 無； |
| 20 | ||
| 50 | ||
| SSS-NCH | 10 | 尖探針，鍍層: 無； 針尖形狀: 懸臂梁: 頻率 330 kHz 力常數(shù) 42 N/m 長度 125 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| SSS-NCHR | 10 | 尖探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 懸臂梁: 頻率 330 kHz 力常數(shù) 42 N/m 長度 125 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| AR5-NCH | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1 |
| 20 | ||
| 50 | ||
| AR5-NCH-W | 370 | |
| AR5T-NCH | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1,tilt compensation 13° |
| 20 | ||
| 50 | ||
| AR5T-NCH-W | 365 | |
| AR10-NCH | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1 |
| 20 | ||
| 50 | ||
| AR10-NCH-W | 370 | |
| AR10T-NCH | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1, tilt compensation 13° |
| 20 | ||
| 50 | ||
| AR10T-NCH-W | 365 | |
| AR5-NCHR | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1, detector side :Al-coating |
| 20 | ||
| 50 | ||
| AR5-NCHR-W | 370 | |
| AR5T-NCHR | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥5:1,tilt compensation 13°detector side: Al-coating |
| 20 | ||
| 50 | ||
| AR5T-NCHR-W | 365 | |
| AR10-NCHR | 10 | HIGH ASPECT RATIO Probe,silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1 detector side :Al-coating |
| 20 | ||
| 50 | ||
| AR10-NCHR-W | 370 | |
| AR10T-NCHR | 10 | TILT COMPENSATED HIGH ASPECT RATIO Probe, silicon cantilever for non-contact-/tapping-mode, HIGH ASPECT RATIO tip,aspect ratio ≥10:1, tilt compensation 13°detector side: Al-coating |
| 20 | ||
| 50 | ||
| AR10T-NCHR-W | 365 | |
| DT-NCHR | 10 | DIAMOND COATED Probe, silicon cantilever for non-contact-/tapping-mode, detector side: Al-coating |
| 20 | ||
| 50 | ||
| CDT-NCHR | 10 | CONDUCTIVE DIAMOND COATED Probe, silicon cantilever for non-contact-/tapping-mode, detector side: Al-coating |
| 20 | ||
| 50 | ||
| PPP-NCST | 10 | 輕敲探針，鍍層: 無，針尖形狀: 錐形; 懸臂梁: 頻率 160 kHz 力常數(shù) 7.4 N/m 長度 150 μm; 應(yīng)用范圍：軟輕敲探針 |
| 20 | ||
| 50 | ||
| PPP-NCST-W | 380 | |
| PPP-NCSTR | 10 | 輕敲探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 錐形; 懸臂梁: 頻率 160 kHz 力常數(shù) 7.4 N/m 長度 150 μm; 應(yīng)用范圍：軟輕敲探針 |
| 20 | ||
| 50 | ||
| PPP-NCSTR-W | 380 | |
| PPP-NCSTPt | 10 | 導(dǎo)電探針，鍍層: 鉑銥； |
| 20 | ||
| 50 | ||
| PPP-NCSTPt-w | 380 | |
| PPP-NCSTAu | 10 | Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Au-coating |
| PPP-NCSTAuD | 10 | Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Au-coating |
| PPP-XYNCSTR | 10 | Silicon cantilever for non-contact-/tapping -mode,soft tapping, detector and tip side : Al-coating,XY-auto aligment |
| 20 | ||
| 50 | ||
| PPP-NCL | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever |
| 20 | ||
| 50 | ||
| PPP-NCL-W | 380 | |
| PPP-NCLR | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Al-coating |
| 20 | ||
| 50 | ||
| PPP-NCLR-W | 380 | |
| PPP-NCLPt | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Pt/Ir-coating, tip side : Pt/Ir-coating |
| 20 | ||
| 50 | ||
| PPP-NCLPt-W | 380 | |
| PPP-NCLAu | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector and tip side : Au-coating |
| PPP-NCLAuD | 10 | Silicon cantilever for non-contact -/tapping -mode, long cantilever, detector side : Au-coating |
| PL2-NCL | 10 | Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact-/tapping -mode,long cantilever |
| PL2-NCLR | 10 | Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact-/tapping -mode,long cantilever, detector side: Al-coating |
| TL-NCL | 10 | Tipless silicon cantilever based on POINTPROBE technology |
| 20 | ||
| 50 | ||
| SSS-NCL | 10 | 尖探針，鍍層: 無； 針尖形狀: 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長度 225 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| SSS-NCLR | 10 | 尖探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長度 225 μm; 應(yīng)用范圍：輕敲探針 |
| 20 | ||
| 50 | ||
| AR5-NCL | 10 | 高長徑比探針，鍍層: 無； 針尖形狀: 高長徑比; 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長度 225 μm; 應(yīng)用范圍：高長徑比探針 |
| 20 | ||
| 50 | ||
| AR5-NCL-W | 370 | |
| AR5-NCLR | 10 | 高長徑比探針，鍍層: 懸臂背面鍍鋁； 針尖形狀: 高長徑比; 懸臂梁: 頻率 190 kHz 力常數(shù) 48 N/m 長度 225 μm; 應(yīng)用范圍：高長徑比探針 |
| 20 | ||
| 50 | ||
| AR5-NCLR-W | 370 | |
| DT-NCLR | 10 | 金剛石探針，高長徑比探針，硅懸臂非接觸式- /敲擊模式，鍍層: 懸臂背面鍍鋁 |
| 20 | ||
| 50 | ||
| CDT-NCLR | 10 | 導(dǎo)電金剛石探針，高長徑比探針，硅懸臂非接觸式- /敲擊模式，鍍層: 懸臂背面鍍鋁 |
| 20 | ||
| 50 | ||
| A-Probe | 10 | AKiyama-Probe, self-sensing and self-actuating(-exciting) probe for dynamic mode AFM |
| PPP-SEIH | 10 | Silicon cantilever for non-contact/tapping -mode,special type A. |
| 20 | ||
| 50 | ||
| PPP-SEIH-W | 380 | |
| PPP-SEIHR | 10 | Silicon cantilever for non-contact/tapping -mode,special type A, detector side : Al-coating |
| 20 | ||
| 50 | ||
| PPP-SEIHR-W | 380 |
