租賃、供應(yīng)Agilent86100A,Agilent86100A,Agilent86100C,Agilent86100D光帶寬眼圖分析儀
| 帶寬 | 無 |
|---|---|
| 顯示屏尺寸 | 10.4 英寸 |
| 本底噪聲 | 無 |
| 支持的數(shù)據(jù)速率 | 無 |
| 輸入類型 | 無 |
| 模塊類型 |
|
| 應(yīng)用 |
|
| 操作系統(tǒng) | Windows 7 |
| 等效時(shí)間 | 是 |
選件和升級
- 選件
- 保修、校準(zhǔn)和服務(wù)
選件
了解詳細(xì)信息: 查看配置指南
| Trigger and Timebase | |||
| 86100D-ETR | Enhanced trigger, 13 GHz BW, pattern and module trigger | ||
| 86100D-STR | Standard trigger 3.2 GHz BW (default option) | ||
| 86100D-PTB | Internal Precision Timebase | ||
| Fixed Node-Locked SW Licenses | |||
| 86100D-SIM | InfiniiSim-DCA 波形轉(zhuǎn)換工具套件
查看詳情 | ||
| 86100D-300 | *幅度分析/RIN/Q 因數(shù)
查看詳情 | ||
| 86100D-202 | 86100C-202 增強(qiáng)型阻抗和 S 參數(shù)軟件
查看詳情 | ||
| 86100D-201 | *波形分析軟件
查看詳情 | ||
| 86100D-200 | 增強(qiáng)型抖動分析軟件
查看詳情 | ||
| 86100D-062 | MATLAB - Standard Digital Analysis Package, Fixed Perpetual License | ||
| 86100D-061 | MATLAB - Basic Digital Analysis Package, Fixed Perpetual License | ||
| 86100D-500 | 生產(chǎn)力套裝軟件
查看詳情 | ||
| 86100D-401 | Advanced Eye Analysis Software, Fixed Perpetual License | ||
| 86100D-9FP | 86100D-9FP 用于 86100D DCA-X 示波器的 PAM-N 分析軟件
查看詳情 | ||
| 86100D-BFP | Automatic Fixture Removal in TDR Mode, Fixed Perpetual License | ||
| 86100D-TFP | IEEE TDECQ analysis, fixed perpetual license | ||
| Storage | |||
| 86100D-092 | Internal hard drive (default option) | ||
| 86100D-090 | Removable hard drive | ||
| Calibration Documentation | |||
| 86100D-UK6 | Commercial calibration certificate with test data | ||
| Peripheral Connection | |||
| 86100D-GPN | No GPIB Card Interface | ||
| 86100D-GPI | GPIB Card Interface - Installed | ||
| Accessories | |||
| 86100D-AXE | Rack mount kit with handles | ||
| 86100D-AX4 | Rack mount kit without handles | ||
| 86100D-AFP | Module slot filler panel | ||
| Transportable SW Licenses | |||
| 86100DT-SIM | InfiniiSim-DCA Waveform Transformation SW, Transportable License | ||
| 86100DT-500 | Productivity Package, Transportable License | ||
| 86100DT-401 | Advanced Eye Analysis, Transportable License | ||
| 86100DT-300 | Advanced Amplitude Analysis/RIN/Q-Factor , Transportable License | ||
| 86100DT-202 | Enhanced Impedance and S-parameter Software, Transportable License | ||
| 86100DT-201 | Advanced Waveform Analysis, Transportable License | ||
| 86100DT-200 | Enhanced Jitter Analysis, Transportable License | ||
| 86100DT-9TP | PAM-N Analysis SW, Transportable Perpetual License | ||
| 86100DT-BTP | Automatic Fixture Removal in TDR Mode, Transportable License | ||
| 86100DT-ETP | Flex Eye - Independent Channel Acquisition and Control, Transportable License | ||
| 86100DT-TTP | IEEE TDECQ analysis, transportable perpetual license | ||
保修、校準(zhǔn)和維修
了解詳細(xì)信息: 查看配置指南
| PS-S10 | Remote scheduled productivity assistance. Select 1 to 999 hours. | ||
| PS-S20-01 | Recommended Startup assistance, daily | ||
| PS-S20 | Startup assistance, daily | ||
| R-51B-001-5CC | Warranty Assurance Plan - RTK - 2 add'l years (Total 5 years) | ||
| Calibration service plan | |||
| R-50C-011-3 | Calibration Assurance Plan - Return to Keysight - 3 years | ||
| R-50C-011-5 | Calibration Assurance Plan - Return to Keysight - 5 years | ||
| R-50C-011-MU-3 | Keysight Calibration + Uncertainties - 3 years | ||
| R-50C-011-MU-5 | Keysight Calibration + Uncertainties - 5 years | ||
| R-50C-016-3 | Keysight Calibration + Uncertainties + Guardbanding - 3 years | ||
| R-50C-016-5 | Keysight Calibration + Uncertainties + Guardbanding - 5 years | ||
| R-50C-021-3 | ANSI Z540-1-1994 Calibration - 3 years | ||
| R-50C-021-5 | ANSI Z540-1-1994 Calibration - 5 years | ||
技術(shù)指標(biāo)
- 是德科技Infiniium DCA-X 86100D高帶寬示波器主機(jī)和模塊
- DCA Accessories - Technical Overview
手冊
- 探頭資源中心
- 86100A/B/C/D Infiniium DCA Programmer's Guide
- 86100 Infiniium DCA Online Help Archive
手冊和競爭力概覽
- Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Brochure
- 開啟測量新視野，助您實(shí)現(xiàn)設(shè)計(jì)
- 從電氣到協(xié)議的 PCI Express® 設(shè)計(jì)與測試――手冊
- 更多
選擇與配置指南
- 86100D DCA Wide-Bandwidth Oscilloscope Family - Configuration Guide
- DCA Selection and Configuration Guide
演示
- 86100D Infiniium DCA-X Wide-Bandwidth Oscilloscopes Demo
- N4917B 光接收機(jī)極限測試解決方案 ― 優(yōu)酷視頻
- N1010A FlexDCA Virtual Device Demonstration
- 更多
支持文檔
探討此產(chǎn)品如何應(yīng)對特定的測量挑戰(zhàn)。
- 應(yīng)用說明
- 文章和案例分析
| 德科技等效時(shí)間采樣示波器和實(shí)時(shí)示波器的差別？ 德科技等效時(shí)間采樣示波器和實(shí)時(shí)示波器的差別？ |
| 是德科技 信號完整性分析系列 是德科技 信號完整性分析系列 |
| Precision Jitter Transmitter - DesignCon 2005 Precision Jitter Transmitter whitepaper |
| Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN). |
| Time Domain Reflectometry Theory - Application Note When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics. |
| Equalization: The Correction and Analysis of Degraded Signals - Application Note This whitepaper introduces engineers to the concepts of equalization and terms used in the development of emerging technologies that use standard materials (e.g., FR4) for buses and backplanes at ever higher rates. |
| Comparison of Different Jitter Analysis Techniques With a Precision Transmitter - Application Note This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter. |
| Precision Jitter Analysis Using the Keysight 86100C DCA-J - Application Note This product note provides a guide to making jitter measurements with the Keysight 86100C DCA-J. |
| “適用于高速數(shù)字通信的精密波形分析”技術(shù)概述 his document will discuss the Keysight 86108A precision waveform analyzer plug-in module with the Keysight 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals. |
| Techniques for Higher Accuracy Optical Measurements - Application Note Learn techniques for high accuracy optical measurements using System Impulse Response Correction |
| Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface Keysight continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals. |
| Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters - Application Note Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do. |
| SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8 |
| High Precision Time Domain Reflectometry - Application Note Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines. |
| Advanced Jitter Generation and Analysis Product Note - Application Note This product note shows how the Keysight pulse generators can be used with the DCA-J Oscilloscope. |
| Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis |
| Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s. |
| Improving Optical Transceiver Extinction Ratio Measurement Accuracy This paper discusses how to improve optical transceiver extinction ratio measurement accuracy by using reference receiver correction factors. |
| Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment. |
