HIGHLIGHTS
The New Standard
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 20 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
- Wide frequency coverage from 9 kHz to 4.5/6.5/9/14/20 GHz
- Fully capture device performance with a wide dynamic range of 140 dB
- Achieve complete device characterization with optional built in DC sources, bias tees, pulse generators and pulse modulators
- Consistently test between R&D and production with the same UI and SCPI commands as high-end PNAs.
- Improve throughput by performing spectrum analysis, pulsed-RF measurements, vector mixer measurements, noise figure, and more on a single instrument
